Fault Model Analysis of SRAM Single Event Upset Induced by Pulsed Laser

Fault Model Analysis of SRAM Single Event Upset Induced by Pulsed Laser

LI Yue, ZHU Xiang, JIANG Hui-Long, HAN Jian-Wei

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Journal of Cryptologic Research ›› 2021, Vol. 8 ›› Issue (6) : 1074-1081. DOI: 10.13868/j.cnki.jcr.000497

Fault Model Analysis of SRAM Single Event Upset Induced by Pulsed Laser

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{{article.zuoZheEn_L}}. {{article.title_en}}. {{journal.qiKanMingCheng_EN}}. 2021, 8(6): 1074-1081 https://doi.org/10.13868/j.cnki.jcr.000497

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